XISPUTPIXELQUALITY (May 2007) suzaku.xis XISPUTPIXELQUALITY (May 2007) NAME xisputpixelquality -- put pixel quality code (PIXEL_QUALITY or STATUS) for each XIS event USAGE xisputpixelquality infile outfile DESCRIPTION Put pixel quality code (PIXEL_QUALITY or STATUS) for each XIS event. The pixel quality code is defined in XISputPixelQuality.h as follows. Note that logical OR is applied to the pixel quality code of each pixel. Note also that hotpixels identified in the Dark Init/Update mode in the XIS DE onboard software are NOT taken into account in the current version of the xisputpixelquality. ===================================================== bit decimal description ===================================================== B0 1 reserved B1 2 edge of area-dsicri area B2 4 two pixels apart from the segment boundary B3 8 two pixels apart from the preceding pixels in a bad column B4 16 two pixels apart from bad CTE columns B5 32 two pixels apart from hot pixels B6 64 two pixels apart from flickering pixels B7 128 two pixels apart from the window/frame boundary B8 256 one pixel apart from the segment boundary B9 512 pixels at the 3rd trailing row of the SCI rows B10 1024 one pixel apart from the preceding pixels in a bad column B11 2048 preceding pixels in a bad column B12 4096 one pixel apart from bad CTE columns B13 8192 one pixel apart from hot pixels B14 16384 one pixel apart from flickering pixels B15 32768 pixels at the 2nd preceding row of the SCI rows B16 65536 inside the calibration mask area B17 131072 segment boundary B18 262144 pixels at the 2nd trailing row of the SCI rows B19 524288 one pixel apart from the frame/window boundary B20 1048576 bad CTE columns B21 2097152 hot pixels B22 4194304 flickering pixels B23 8388608 frame/window boundary B24 16777216 outside of aread-discri area B25 33554432 other kinds of bad pixels B26 67108864 reserved B27 134217728 reserved B28 268435456 pixels at the preceding row of the SCI rows B29 536870912 pixels at the trailing row of the SCI rows B30 1073741824 pixels at the SCI rows and read with AP4 or AP256 B31 2147483648 pixels at the SCI rows ===================================================== PARAMETERS infile [filename] Input event FITS file. outfile [filename] Name of output event fits file. (ignore_frames = yes) [boolean] Flag to ignore the FRAMES extension. (enable_scipixq = yes) [boolean] Flag to enable SCI pixel quality bits. (badcolumfile = CALDB) [filename] Input file that describes the XIS bad columns and flickering pixels. This file is generally located in CALDB, and the file name is ae__badcolum_YYYYMMDD.fits where is a string set to indicate the sensor name (xi0, xi1, xi2, xi3) and YYYYMMDD is the release date. (calmaskfile = CALDB) [filename] Input file that describes the irradiation area of the 55Fe calibration source on XIS CCD. This file is located in CALDB. The name is ae__calmask_YYYYMMDD.fits where is a string set to xi0, xi1, xi2, xi3 indicating the sensor and YYYYMMDD is the release date. (anl_verbose = -1) [integer] ANL verbose level (-1:full, 0:minimum) (anl_profile = yes) [boolean] Enable ANL module profiling (num_event = -1) [integer] number of event (-1:all, 0:exit) (event_freq = 10000) [integer] Event number printout frequency (chatter = 2) [integer] message chatter level (0:min, 2:norm, 5:max) EXAMPLES 1. Read position information of each event from the EVENTS extension of the input file, ae20050914_1728_1929_xis0_3x3.fff, and put a pixel quality code in PIXEL_QUALITY column (or STATUS column) in the newly created output file, ae20050914_1728_1929_xis0_3x3_uf.sff. The definition of the pixel quality code is summarized above. Locations of bad CTE columns, flickering pixels are written in the CALDB file, ae_xi0_badcolumn_20051003.fits. Calibration source area on the XIS CCD is defined in the CALDB file, ae_xi0_calmask_20050802.fits. Note that xisputpixelquality does not have a function to search for bad columns or flikering pixels. % xisputpixelquality infile=ae20050914_1728_1929_xis0_3x3.fff \ outfile=ae20050914_1728_1929_xis0_3x3_uf.sff BUGS SEE ALSO AUTHOR Kiyoshi Hayashida (Osaka University), Y.ISHISAKI (TMU), and the XIS team. LAST MODIFIED May 2007