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OM Artifacts and General Information

Before proceeding with the pipeline, it is appropriate to discuss the artifacts that often affect OM images. These can affect the accuracy of a measurement by, for example, increasing the background level. Some of these can be seen in Fig. 9.1.

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Stray light - background celestial light is reflected by the OM detector housing onto the center on the OM field of view, producing a circular area of high background. This can also produce looping structures and long streaks.
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Modulo 8 noise - In the raw images, a modulo 8 pattern arises from imperfections in the event centroiding algorithm in the OM electronics. This is removed during image processing.
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Smoke rings - light from bright sources is reflected from the entrance window back on the detector, producing faint rings located radially away from the center of the field of view.
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Out-of-time events - sources with count rates of several tens of counts/sec show a strip of events along the readout direction, corresponding to photons that arrived while the detector was being read out.

Further, artifacts also can contaminate grism data. Due to this mode's complexity, users are urged to be very careful when working with grism data, and should refer to the SOC's website on this topic.

Users should also keep in mind some differences between OM data and X-ray data. Unlike EPIC and RGS, there are no good time intervals (GTIs) in OM data; an entire exposure is either kept or rejected. Also, OM exposures only provide direct energy information when in grism mode, and the flat field response of the detector is assumed to be unity.


next up previous contents
Next: A Quick Look at Up: An OM Data Processing Previous: An OM Data Processing   Contents
Lynne Valencic 2011-07-26