XMM-Newton Science Analysis System: Users' Guide

List of Figures

• 1. SAS GUI window
• 2. SAS parameter dialog
• 3. SAS dataset browser
• 4. warning
• 5. Calibration state server (calview window)
• 6. Organisation of the EPIC-MOS chain: merging the event lists. The files in boldly dashed boxes are used (or produced) if they exist. The files in simply dashed boxes are options of the individual tasks not used in the current chain.
• 7. Organisation of the EPIC-MOS chain at CCD/node level with file inputs. Same conventions as in Fig. 6.
• 8. Pipeline processing of the EPIC pn observation data.
• 9. Images of all events with $\mbox{PHA}=20\mbox{ adu}$ in detector coordinates, before (left) and after (right) correcting the energy scale in specific pixels, but before suppressing noise events. The color scale extends from 0 to 50 events per pixel. Black patches indicate areas where no 20 adu information is available.
• 10. Images of all events with $\mbox{PHA}=20\mbox{ adu}$ in detector coordinates, after suppressing noise events. Left: processed with the standard setting of epreject. Right: processed with noiseparameters="0.98 0.97 0.97 0.97 1.0 1.01 0.96 1.0 1.0 1.0 1.0 1.0 1.0". The color scale extends from 0 to 5 events per pixel.
• 11. Vela SNR images in the energy range 120-200 eV, in sky coordinates. Left: processed without epreject, scale: 0-40 events/pixel. Right: processed with epreject, scale: 0-20 events/pixel.
• 12. List of EPIC-MOS patterns: the upper panel for imaging mode should be interpreted as follows: each pattern is included in a 5 x 5 matrix used for proximity analysis, a pattern is centered by definition on the pixel with highest charge, this central pixel is colored in red, the other pixels above threshold in the pattern are colored in green, all pixels colored in white must be below threshold, the crossed pixels are indifferent (they can be above threshold). The philosophy for patterns 0-25 is that a good X-ray pattern must be compact, with the highest charge at the center, and isolated (all pixels around are below threshold). Patterns 26-29 are the so-called diagonal patterns, not expected from a genuine X-ray, but which can arise in case of Si-fluorescence or of pileup of two monopixel events. The lower panel for timing mode should be interpreted in the same way as in imaging mode, with the difference that the place where maximum charge occurs is ignored. Due to this, all doubles appear as Pattern 1, whether leading or trailing. Patterns 2 and 3 are mostly not due to true X-rays, but to cosmic-ray tracks.
• 13. List of valid EPIC-pn patterns (cf. Fig. 12). Here ``.'' marks a pixel without an event above threshold, ``X'' is the pixel with the maximum charge (`main pixel'), `x' is the pixel with a non-maximum charge, ``m'' is the pixel with the minimum charge. These 13 figures refer to the SAS PATTERN codes 0 (singles), 1-4 (doubles), 5-8 (triples) and 9-12 (quadruples), respectively. The RAWX co-ordinate is running rightward and the RAWY co-ordinate running upward.
• 14. Effect of OoT events on images: The upper left panel contains a 2-10 keV band image of a pn observation of a bright source in full frame mode with the OoT events visible as a strip running along the length of the CCD. The upper right panel depicts the modeled OoT event distribution whereas in the lower left panel these are subtracted from the original image. The lower right panel shows the distribution of cleaned events in the soft (0.2-2 keV) energy band for comparison.
• 15. Effect of Out-of-Time events on a source spectrum (in this case the internal calibration source): the black data points display the source spectrum which is still contaminated by OoT events, the red points mark the source spectrum being cleared from OoT events. The energy range displayed is 5-8.5 keV.
• 16. Plot of the pn pattern distribution with energy as produced by epatplot. The deviations of the single, double and single+double distributions from the model are clearly visible.
• 17. Plot of the pn pattern distribution with energy as produced by epatplot. After exclusion of the inner part of the source, the pattern distributions are in agreement with the model curves.
• 18. In the xmmselect main window, an image can be extracted by selecting X/Y as image axis and by pressing the ``Image'' button.
• 19. The evselect main window, where e.g. the selection expression still can be modified.
• 20. The evselect window with the image related parameters, where e.g. the output image name and the binning of the events can be modified.
• 21. Spectrum of a source.
• 22. Graphical User Interface (GUI) of especget showing source and background spatial selection expressions.
• 23. Light-curve of the example data set. Flaring high background periods are clearly visible.
• 24. Light-curve of the example data set after removal of flaring high background periods.
• 25. Sky image of the example data set in the energy range 0.5-7 keV displayed with ds9.
• 26. Selection region properties window, popped-up by double-clicking on the region in the main ds9 window.
• 27. Selection regions for the extraction of source and background spectra.
• 28. Resulting ds9 display of a srcdisplay command issued to overlay a final source list onto a pn image.
• 29. The main xmmselect panel for an RGS1 event list
• 30. The xmmselect Image panel
• 31. Distribution of RGS merged events
• 32. RGS selection regions
• 33. RGS2 light curve of Mkn421
• 34. RGS2 light curve of Mkn421's background
• 35. rgsproc on-line help
• 36. Two sources in the RGS aperture
• 37. Observation of the moderately extended SNR N132D
• 38. The OVIII line in AB Dor
• 39. The fluxed spectrum of HR1099 produced with rgsfluxer made from a combination of 86 1st and 2nd order RGS1 and RGS2 spectra.
• 40. Pipeline processing of data acquired in the OM imaging mode.
• 41. Pipeline processing of data acquired in the OM fast mode.
• 42. Processing of OM grism data.