Next: A Quick Look at
Up: An OM Data Processing
Previous: An OM Data Processing
Contents
OM Artifacts and General Information
Before proceeding with the pipeline, it is appropriate to discuss the artifacts
that often affect OM images. These can affect the accuracy of a measurement by,
for example, increasing the background level. Some of these can be seen in Fig.
9.1.
- Stray light - background celestial light is reflected by the
OM detector housing onto the center on the OM field of view, producing a
circular area of high background. This can also produce looping structures
and long streaks.
- Modulo 8 noise - In the raw images, a modulo 8 pattern arises
from imperfections in the event centroiding algorithm in the OM electronics. This
is removed during image processing.
- Smoke rings - light from bright sources is reflected from
the entrance window back on the detector, producing faint rings located
radially away from the center of the field of view.
- Out-of-time events - sources with count rates of several tens
of counts/sec show a strip of events along the readout direction, corresponding
to photons that arrived while the detector was being read out.
Further, artifacts also can contaminate grism data. Due to this mode's complexity, users
are urged to be very careful when working with grism data, and should refer to the
SOC's website on this topic.
Users should also keep in mind some differences between OM data and X-ray data.
Unlike EPIC and RGS, there are no good time intervals (GTIs) in OM data; an entire
exposure is either kept or rejected. Also, OM exposures only provide direct energy
information when in grism mode, and the flat field response of the detector is
assumed to be unity.
Next: A Quick Look at
Up: An OM Data Processing
Previous: An OM Data Processing
Contents
Lynne Valencic
2011-07-26